A Fault Syndromes Simulator for Random Access Memories

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Executive Summary

Testing and diagnosis techniques play a key role in the advance of semiconductor memory technology. The challenge of failure detection has created intensive investigation on efficient testing and diagnosis algorithm for better fault coverage and diagnostic resolution. At present, the March test algorithm is used to detect and diagnose all faults related to Random Access Memories. This algorithm also allows the faults to be located and identified. However, the test and diagnosis process is mainly done manually. Due to this, a systematic approach for developing and evaluating memory test algorithm is required. This paper is focused on incorporating the March based test algorithm using a software simulator tool for implementing a fast and systematic memory testing algorithm.

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