Date Added: Dec 2010
Extreme technology integration in the sub-micron regime comes with a rapid rise in heat dissipation and power density for modern processors. Dynamic voltage scaling is a widely used technique to tackle this problem when high performance is not the main concern. However, the minimum achievable supply voltage for the processor is often bounded by the large on-chip caches since SRAM cells fail at a significantly faster rate than logic cells when reducing supply voltage. This is mainly due to the higher susceptibility of the SRAM structures to process-induced parameter variations.