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Automated fault diagnosis is emerging as an important factor in achieving an acceptable and competitive cost/dependability ratio for embedded systems. In this paper, the authors introduce model-based diagnosis and spectrum-based fault localization, two state-of-the-art approaches to fault diagnosis that jointly cover the combination of hardware and control software typically found in embedded systems. In this paper, they present an introduction to the field, discuss their recent research results, and report on the application on industrial test cases.
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