Built-In Self-Test of Digital Signal Processors in Virtex-4 FPGAs

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Executive Summary

This paper present a Built-In Self-Test (BIST) approach for testing and diagnosing the embedded Digital Signal Processors (DSPs) in Xilinx Virtex-4 series Field Programmable Gate Arrays (FPGAs). The BIST architecture and configurations needed to test these programmable DSPs in all of their modes of operation are presented along with fault injection and timing analysis of the BIST configurations. Built-In Self-Test (BIST) approaches have been developed for Field Programmable Gate Arrays (FPGAs) by programming some of the Configurable Logic Blocks (CLBs) to function as Test Pattern Generators (TPGs) and Output Response Analyzers (ORAs) .

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