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Increases in peak current draw and reductions in the operating voltage of processors stress the importance of dealing with voltage fluctuations in processors. Noise-margin violations lead to undesired effects, like timing violations, which may result in incorrect execution of applications. Several recent architectural solutions for inductive noise have been proposed that, unfortunately, have a strong correlation to the underlying power-delivery package model and require a feedback loop that is largely constrained by the voltage/current sensor characteristics. The resulting solutions are not robust across a wide range of microprocessor designs and packaging technologies.
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