Design and Implementation of Built-in-Self Test and Repair
Survey of ITRS in 2001,the System-on-Chips (SoCs) is moving from logic dominant chips to memory dominant chips in order to deal with today's and future application requirements. The dominating logic (about 64% in 1999) is changing to dominating memory (approaching 90% by 2011). These shrinking technologies give rise to new defects and new fault models have to be defined to detect and eliminate these new defects. These new fault models are used to develop new high coverage test and diagnostic algorithms. The greater the fault detection and localization coverage, the higher the repair efficiency, hence higher the obtained yield. Memory repair is the necessary, since just detecting the faults is no longer sufficient for SoCs, hence both diagnosis and repair algorithms are required.