Storage

Design of Built-in Self-Repair Strategy with Selectable Redundancy for Embedded SRAM

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Executive Summary

The main strategy of this project is to design a fault diagnoses system for detection and repair of any permanent failures or faults in the embedded read only memories. Built-In Self-Repair (BISR) with redundancy is an effective scheme for embedded memories. Each fault address can be saved only once is the feature of the proposed BISR strategy and is flexible with four operating modes. In BIAA module, fault addresses and redundant ones form a one-to-one mapping to achieve a high repair speed.

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