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The aggressive scaling of CMOS technology has increased the density and allowed the integration of multiple processors into a single chip. Although solutions based on MPSoC architectures can increase application's speed through TLP exploitation, this speedup is still limited to the amount of parallelism available in the application, as demonstrated by Amdahl's Law. Moreover, with the continuous shrinking of device features, very aggressive defect rates are expected for new technologies. Under high defect rates a large amount of processors of the MPSoC will be susceptible to defects and consequently will fail, not only reducing yield but also severely affecting the expected performance.
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