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The paper presents a fast Bit-Error-Rate (BER) test suitable for digital receivers or transceivers. The test technique makes use of an elevated BER which can be achieved by geometrical translation of the signal constellation points on the IQ plane. As the elevated BER requires much less bits (or symbols) to be measured, significant savings in the test time can be anticipated. Also a maximum sensitivity to impairments in the noise factor is obtained in this way. To develop an effective elevated-BER test for a device in mass production a careful characterization procedure must be carried out, followed by a fine tuning procedure aimed at improving the test resolution and thereby the test coverage.
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