Fault Detection and Test Minimization Methods for Combinational Circuits - A Survey
Rapid increase in population increased the usage of digital components dramatically and their production. For profitable income, the cost of the finished product and time taken for marketing the product needs to be reduced. In this paper, the authors conducted extensive survey of methods developed earlier to detect faults and minimize test set in digital circuits. The survey is limited to methods for simple combinational circuits only. In effect, this paper compares 11 different fault detection and test minimization methods for simple circuits.