Mobility

Fault Detection Multipliers in Polynomial and Normal Basis

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Executive Summary

With significant advances in wired and wireless technologies and also increased shrinking in the size of VLSI circuits, many devices have become very large because they need to contain several large units. This large number of gates and in turn large number of transistors causes the devices to be more prone to faults. These faults especially in sensitive and critical applications may cause serious failures and hence should be avoided. In many cryptographic schemes, the most time consuming basic arithmetic operation is the finite field multiplication and its hardware implementation for bit parallel operation may require millions of logic gates.

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