Generating Test Patterns For FPGAs Using Multi-Objective Genetic Algorithm
This paper presents a brief introduction to multi-objective genetic algorithms and FPGAs. In this paper, the authors have discussed that how test pattern generation method can be formulated in terms of CNF form and this CNF form can be used to generate test patterns using genetic algorithm. They have proposed that by applying a multi-objective genetic algorithm on this CNF form they can increase number of instances to satisfy Boolean equation. Without loss of generality, it is assumed here and in the following that each of the n components of the objective vector is to be maximized.