Impact of Partial Resistive Defects and Bias Temperature Instability on SRAM Decoder Reliablity
Partial open defects in modern Static Random Access Memory (SRAM) address decoders are one of the main causes of small delays; these are hard to detect and may result in escapes and reliability problems. In addition, aging failures -such as Bias Temperature Instability (BTI) - may worsen the situation and accelerate the degradation (i.e. increase the delay) and cause sooner field failures. This paper investigates the impact of partial opens and BTI in SRAM address decoders first separately and thereafter in a combined manner.