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Implementation of Concurrent Online MBIST for RFID Memories

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Executive Summary

Concurrent online testing is a memory test mechanism where the memory can be tested concurrently with the system operation. Thus, it has instant error detection. Radio Frequency IDentification (RFID) devices relies on the correct operation of their memory for identification of objects and delivery of transponder's information. This paper presents the implementation of concurrent online test scheme for RFID memories based on Memory Built in Self Test (MBIST) architecture. This paper also presents the Finite State Machine (FSM) of the transponder access scheme, Symmetric transparent version of March c-algorithm, implementation of memory BIST. The solution was implemented using VHDL and was, in turn, verified on Xilinx ISE 9.2i simulator, and synthesized using Spartan 3E kit.

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