Date Added: Jul 2010
Technology scaling has offered advantages to embedded systems, such as increased performance, more available memory and reduced energy consumption. However, scaling also brings a number of problems like reliability degradation mechanisms. The intensive activity of devices and high operating temperatures are key factors for reliability degradation in latest technology nodes. Focusing on embedded systems, the memory is prone to suffer reliability problems due to the intensive use of dynamic memory on wireless and multimedia applications. In this paper, the authors present a new approach to automatically design dynamic memory managers considering reliability, and improving performance, memory footprint and energy consumption.