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The authors present the first approach for post-silicon leakage power reduction through Input Vector Control (IVC) that takes into account the impact of the Manufacturing Variability (MV). Because of the MV, the Integrated Circuits (ICs) implementing one design require different input vectors to achieve their lowest leakage states. They address two major challenges. The first is the extraction of the gate-level characteristics of an IC by measuring only the overall leakage power for different inputs. The second problem is the rapid generation of input vectors that result in a low leakage for a large number of unique ICs that implement a given design, but are different in the post-manufacturing phase.
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