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This paper addresses Integrated Circuit (IC) security issues by using supply voltage based Gate-Level Characterization (GLC). The authors' GLC scheme is capable of characterizing both manifestation and physical level properties of an IC accurately using variable supply voltage. They demonstrate that the proposed scheme can detect three types of IC attacks with low false positives and false negatives. With the fast growth of IC outsourcing, hardware security has become a major concern and has drawn a great deal of attention in the IC industry. IC products from untrusted foundries must be fully tested to ensure that no malicious alterations have been made.
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