LFSR Test Pattern for Fault Detection and Diagnosis for FPGA CLB Cells
The increasing growth of sub-micron technology has resulted in the difficulty of VLSI testing. Test and design for testability are recognized today as critical to a successful design. Field Programmable Gate Arrays (FPGAs) have been used in many areas of digital design. Because FPGAs are reprogrammable, faults can be easily tolerated once fault sites are located. In this paper, the authors discuss about fault detection and fault diagnosis techniques for FPGA CLBs. The most of the discussion will be made using Configurable Logic Block (CLB) instead of whole FPGA for simplicity.