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The problem of matching a forensic sketch to a gallery of mugshot images is addressed in this paper. Previous research in sketch matching offered solutions to matching highly accurate sketches that were drawn while looking at the subject. The authors refer to these as viewed sketches. Forensic sketches differ from viewed sketches in that they are drawn by a police sketch artist using the description provided by an eye-witness who is typically unfamiliar with the subject. To solve the problem of matching forensic sketches, they propose a robust framework, called Local Feature-based Discriminant Analysis (LFDA). In LFDA, they first represent both sketches and photos using gradient location and orientation histograms and multi-scale local binary patterns.
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