Optimal Test Input Sequence Generation for Finite State Models and Pushdown Systems
Finite state machines and pushdown systems are frequently used in model based testing. In such testing, the system under test is abstractly modeled as a finite state machine having a finite set of states and a labeled transition relation between the states. A pushdown system, additionally, has an unbounded stack. Test inputs are then generated by enumerating a set of sequences of transitions labels from the model. There has been a lot of research that focused on generation of test input sequences satisfying various coverage criteria.