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The process of detecting logical faults in Integrated Circuits (ICs) due to manufacturing variations is bottlenecked by the I/O cost of scanning in test vectors and offloading test results. Traditionally, the output bottleneck is alleviated by reducing the number of bits in output responses using XOR networks, or computing signatures from the responses of multiple tests. However, these many-to-one computations reduce test time at the cost of higher detection failure rates, and lower test granularity. In this paper, the authors propose an output compression approach that uses compressive sensing to exploit the redundancy of correlated outputs from closely related tests, and of correlated faulty responses across many circuits.
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