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As the complexity of modern Operating Systems (OS) increases, testing key OS components such as Device Drivers (DD) becomes increasingly complex given the multitude of possible DD interactions. Currently, DD testing entails a broad spectrum of techniques, where static (requiring source code) and dynamic (requiring the executable image) and static-dynamic testing combinations are employed. Despite the sustained and improving test efforts in the field of driver development, DDs still represent a significant cause of system outages as the coverage is invariably limited by test resources and release time considerations. The basic factor is the inability to exhaustively assess and then cover the operational states, leading to releases of inadequately tested DDs.
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