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Recently, Solid State Drive (SSD) based on NAND flash memory chips becomes popular in the consumer electronics market because it is tough on shock and its I/O performance is better than that of conventional hard disk drive. However, as the density of the semiconductor grows higher, the distance between its wires narrows down, their interferences are frequently occurred, and the bit error rate of semiconductor increases. Such frequent error occurrence and short life cycle in NAND flash memory reduce the reliability of SSD.
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