Retrofitting Unit Tests for Parameterized Unit Testing
Recent advances in software testing introduced Parameterized Unit Tests (PUT), which accept parameters, unlike Conventional Unit Tests (CUT), which do not accept parameters. PUTs are more beneficial than CUTs with regards to fault detection capability, since PUTs help describe the behaviors of methods under test for all test arguments. In general, existing applications often include manually written CUTs. With the existence of these CUTs, natural questions that arise are whether these CUTs can be retrofitted as PUTs to leverage the benefits of PUTs, and what is the cost and benefits involved in retrofitting CUTs as PUTs.