Software Reliability Growth Model With Logistic Testing-Effort Function Considering Log-Logistic Testing-Effort and Imperfect Debugging
In this paper, the authors investigate a Software Reliability Growth Model (SRGM) based on the Non Homogeneous Poisson Process (NHPP) which incorporates a logistic testing-effort function. They present Software Reliability Growth Model (SRGM) based on Non-Homogeneous Poisson Process (NHPP), which incorporates the amount of testing effort consumptions during software testing phase. The time dependent behavior of testing effort consumptions is described by Log-Logistic curve. Has used this model into SRGM for finite failure NHPP. In this paper, they will show that a Log-Logistic Test-Effort Function (TEF) can be expressed as a Software Development/test-effort curve.