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As device sizes shrink, device-level manufacturing challenges have led to increased variability in physical circuit characteristics. Exponentially increasing circuit density has not only brought about concerns in the reliable manufacturing of circuits, but has also exaggerated variations in dynamic circuit behavior. The resulting uncertainty in performance, power, and reliability imposed by compounding static and dynamic non-determinism threatens to halt the continuation of Moore's law, which has been arguably the primary driving force behind technology and innovation for decades.
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