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The continued scaling of device dimensions and the operating voltage reduces the critical charge and thus natural noise tolerance level of transistors. As a result, circuits can produce transient upsets that corrupt program execution and data. Redundant execution can detect and correct circuit errors on the fly. The increasing prevalence of multi-core architectures makes coarse-grain ThreadLevel Redundancy (TLR) very attractive. While TLR has been extensively studied in the context of single-threaded applications, much less attention is paid to the design issues and tradeoffs of supporting parallel codes.
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