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Increasing transistor density in nanometer integrated circuits has resulted in large on-chip power density. As a high-level power optimization technique, voltage partitioning is effective in mitigating power density. Previous works on voltage partitioning attempt to address it through minimizing total power consumption over all voltage partitions. Since power density significantly impacts thermal-induced reliability, it is also desired to directly mitigate peak power density during voltage partitioning. Unfortunately, none of the existing works consider this. This paper proposes an efficient optimal voltage partitioning algorithm for peak power density minimization.
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