Error Correction Code Multi-Switch Nanomemory Demultiplexer: Performance and Reliability Analysis
In this paper, the performance and reliability analysis of a crossbar molecular switch nanomemory demultiplexer is studied and results presented. In particular, they investigate the impact on the performance of a crossbar nanomemory demultiplexer of implementing a combination of error correction coding and multi-switch junction fault tolerance schemes. Results indicate that delay and power scale linearly with increasing number of redundant molecular switch junctions. Results also show that by implementing a redundancy of k = 3 and error correction code Hamming distance d = 2, the demultiplexer reliability can be improved to approximately 99% when there is a 20% probability of errors occurring in the demultiplexer.