Error Resilient Estimation and Adaptive Binary Selection for Fast and Reliable Identification of RFID Tags in Error-Prone Channel
In RFID systems, far field passive tags send information using back scattering. The signal level is typically very small, so channel error during transmission may occur frequently. Due to channel error, performance of RFID tag identification under error-prone channel is degraded compared to that under error-free channel. In this paper, the authors propose a novel error resilient estimation and adaptive binary selection to overcome the problem of channel errors. Their proposed error resilient estimation algorithm can estimate the number of tags and the channel state accurately regardless of frame errors.