Performance and Reliability Analysis of a Scaled Multi-Switch Junction Crossbar Nanomemory and Demultiplexer
This paper presents a performance and reliability analysis of a scaled crossbar molecular switch memory and demultiplexer. In particular, the authors compare their multi-switch junction fault tolerance scheme with a banking defect tolerance scheme. Results indicate that delay and power scale linearly with increasing number of redundant molecular switch junctions. The multi-switch junction scheme was also shown to achieve greater than 99% reliability for molecular switch junction failures rates less than 20%, when a redundancy of at least 3 was implemented.