Reliability and Fault Tolerance of Ultra Low Voltage High Speed Differential CMOS
Source: University of Oslo
The reliability and fault tolerance of the differential ultra low voltage gate is elaborated in this paper. The gates optimal yield and defect tolerance compared to ULV gate and standard CMOS is given. The results are obtained through Monte-Carlo simulations. The transistor is one of the key components that have made possible the plethora of portable electronic gadgets that enriches our everyday life. On the other hand the consumer market has dramatically increased demands for sophisticated portable electronics such as laptop computers and cellular phones. Portable electronics drive the need for low power and low voltage due to a limited budget set by a fixed maximum battery mass, while on the other hand demand for high performance electronics regarding speed.