Statistical Fault Injection

It is well known that soft errors in logic are a concern in modern VLSI circuits. Recent studies on the IBM POWER6 microprocessor using particle-beam irradiation and full core Statistical Fault Injection (SFI) have shown the importance of microarchitectural "Derating" for accurate representation of Soft Error Rate (SER). There, the remarkable error resiliency of POWER6 was clearly demonstrated by categorizing the destiny of bit flip events in a beam experiment which resulted in over 5,600 fully recovered events including SRAM array events