Trusted Integrated Circuits: A Nondestructive Hidden Characteristics Extraction Approach

The authors have developed a methodology for unique identification of Integrated Circuits (ICs) that addresses untrusted fabrication and other security problems. The new method leverages nondestructive gate-level characterization of ICs post-manufacturing, revealing the hidden and unclonable uniqueness of each IC. The IC characterization uses the externally measured leakage currents for multiple input vectors. They have derived several optimization techniques for gate-level characterization. The probability of collision of IDs in presence of intra- and inter-chip correlations is computed.