A Comparison of Statistical Techniques for Detecting Side-Channel Information Leakage in Cryptographic Devices
The evaluation of the resilience of cryptographic devices against side-channel adversaries is an issue of increasing importance. The development of a standardized testing methodology for side-channel resistance of crypto-graphic devices is an issue that has received recent focus from standardization bodies such as NIST. Statistical techniques such as hypothesis and significance testing appear to be ideally suited for this purpose. In this paper, the authors evaluate the candidacy of three such tests: a t-test proposed by Cryptography Research Inc., and two mutual information-based tests.