A Design-for-Diagnosis Technique for SRAM Write Drivers

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Provided by: European Design and Automation Association
Topic: Storage
Format: PDF
Diagnosis is becoming a major concern with the rapid development of semiconductor memories. It provides information about the location of manufacturing defects in the memory, and its effectiveness allows a fast yield ramp up. Most of existing diagnosis methods uses a fault dictionary to provide detailed information of fault localization. However, these solutions are most of the time unable to distinguish between all faults, and more importantly often fail to identify the actual faulty block of the memory.
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