A Discussion of Software Reliability Growth Models with Time-Varying Learning Effects

Provided by: Science Publishing Group
Topic: Software
Format: PDF
Over the last few decades, Software Reliability Growth Models (SRGM) has been developed to predict software reliability in the testing/debugging phase. Most of the models are based on the Non-Homogeneous Poisson Process (NHPP), and an S or exponential-shaped type of testing behavior is usually assumed. Researcher provided an SRGM that considers learning effects, which is able to reasonably describe the S and exponential-shaped behaviors simultaneously. This paper considers both linear and exponential-learning effects in an SRGM to enhance the model by researcher, assumes the learning effects depend on the testing-time, and discusses when and what learning effects would occur in the software development process.

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