A Genetic Approach to Detect Bridging Faults, Transitional Delay Faults and Stuck at Faults in LSI Circuits

Provided by: Serials Publications
Topic: Hardware
Format: PDF
A novel algorithm based on Genetic approach for diagnosing bridging faults, transitional delay faults and stuck at faults in LSI circuits is presented. The method of devising a universal set for detecting Bridging faults in testable circuits is investigated. The authors outline a method that utilizes the information from the stuck-at fault model to accurately diagnose the bridging faults that affect two lines. The proposed method uses the observation that the bridging fault response matches the stuck at fault responses on the shorted lines for the failing test vectors.

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