A Linearity-Enhanced Time-Domain CMOS Thermostat with Process-Variation Calibration

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Provided by: MDPI AG
Topic: Hardware
Format: PDF
In this paper, the authors propose a linearity-enhanced time-domain Complementary Metal-Oxide Semiconductor (CMOS) thermostat with process-variation calibration for improving the accuracy, expanding the operating temperature range and reducing test costs. For sensing temperatures in the time domain, the large characteristic curve of a CMOS inverter markedly affects the accuracy, particularly when the operating temperature range is increased. To enhance the on-chip linearity, this paper proposes a novel temperature-sensing cell comprising a simple buffer and a buffer with a thermal-compensation circuit to achieve a linearized delay.
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