A New Approach for Leakage Power Reduction Techniques in Deep Submicron Technologies in CMOS Circuit for VLSI Applications

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Provided by: International Journal of Advanced Research in Computer Science and Software Engineering (IJARCSSE)
Topic: Hardware
Format: PDF
In CMOS circuits, the reduction of the threshold voltage due to voltage scaling leads to increase in sub threshold leakage current and hence, static power dissipation. For the most recent CMOS feature sizes (e.g., 45nm and 65nm), leakage power dissipation has become an overriding concern for VLSI circuit designers. ITRS reports that leakage power dissipation may come to dominate total power consumption. In the nanometer technology regime, power dissipation and process parameter variations have emerged as major design considerations. These problems continue to grow with leakage power becoming a dominant form of power consumption.
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