A New Low Energy BIST Using A Statistical Code

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Provided by: Institute of Electrical & Electronic Engineers
Topic: Hardware
Format: PDF
To tackle with the increased switching activity during the test operation, this paper proposes a new Built-In Self Test (BIST) scheme for low energy testing that uses a statistical code and a new technique to skip unnecessary test sequences. From a general point of view, the goal of this technique is to minimize the total power consumption during a test and to allow the at-speed test in order to achieve high fault coverage. The effectiveness of the proposed low energy BIST scheme was validated on a set of ISCAS '89 benchmark circuits with respect to test data volume and energy saving.
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