Provided by: Bentham Science Publishers
Date Added: Sep 2014
Recent patents and progress on scan chain balance algorithms have been reviewed. With a significant increase of the SoC (System-on-Chip) integration and scale, the test time of SoC increase dramatically, and this makes the test cost of SoC grow rapidly. In order to reduce test cost and expense, the paper proposes an OBBO (Opposition-based learning and Biogeography Based Optimization) algorithm and designs wrapper scan chains for the IP (Intellectual Property) using OBBO algorithm, which can make wrapper scan chains equilibration so that the authors can make the test time of IP be minimum.