A Novel Built-in Self Test Algorithm for Functional Broadside tests

In this paper, the authors propose a method for on-chip generation of weighted test sequences for synchronous sequential circuits. For combinational circuits, three weights, 0, 0.5 and 1, are sufficient to achieve complete coverage of stuck-at faults, since these weights are sufficient to reproduce any specific test pattern. For sequential circuits, the weights they use are defined based on subsequences of a deterministic test sequence. Such weights allow them to reproduce parts of the test sequence and help ensure that complete fault coverage would be obtained by the weighted test sequences generated.

Provided by: International Journal of Engineering Trends and Technology Topic: Hardware Date Added: Nov 2014 Format: PDF

Find By Topic