A Review of Methodologies for Testing and Locating Faults in Integrated Circuits

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Provided by: International Journal of Emerging Trends & Technology in Computer Science (IJETTCS)
Topic: Hardware
Format: PDF
The recent advances in semiconductor integration technology resulted in manufacturing of very large number of components on a single chip. For reliable system-on-chip, the circuit should be fault free since a single fault is likely to make the whole chip useless. Locating the faults and application of corrective measures for same chip would reduce the running cost of the system. In this paper, various works related to testing and locating faults in integrated circuits is reviewed. The literature related to digital and analog integrated circuits fault is considered.
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