With wide applicability of flash memory in various application domains, reliability has become a very critical issue. This paper is motivated by the needs to resolve the lifetime problem of flash memory and a strong demand in turning thrown-away flash-memory chips into downgraded products. The authors propose a set-based mapping strategy with an effective implementation and low resource requirements, e.g., SRAM. A configurable management design and wear-leveling issue are considered. The behavior of the proposed method is also analyzed with respect to popular implementations in the industry.