In this paper, the authors propose the static time analysis of 32 page Single Cycle Access (SCA) architecture for logic test. The timing analysis of each and very path of Logic test are observed that is setup and hold timings are calculated. It also eliminates the peak power consumption problem of conventional shift-based scan chains and reduces the activity during shift and capture cycles using clock-gating technique. This leads to more realistic circuit behavior during at-speed tests. It enables the complete test to run at much higher frequencies equal or close to the one in functional mode.