A Versatile Microcontroller Based Semiconductor Device Tester

Provided by: International Association of Engineering and Management Education (IAEME)
Topic: Hardware
Format: PDF
In this paper, the authors propose the design and development of a simple, low cost tester system for diode, Bipolar Junction Transistor (BJT), and Junction Field Effect Transistor (JFET). The basic building blocks for this tester design include PIC 18F452 microcontroller, analog multiplexer/demultiplexer 74HC4052, 12 bit Digital to Analog Converter (DAC) MCP4822, operational amplifier LM741 and Liquid Crystal Display (LCD). The tester system discussed in this paper, provides accurate identification of semiconductor device under test (diode, BJT and JFET), types of bipolar transistor (NPN and PNP), types of junction field effect transistor (N channel JFET and P channel JFET).

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