International Journal of Innovative Research in Science, Engineering and Technology (IJIRSET)
Pseudorandom Built-In Self-Test (BIST) generators have been globally used to test integrated circuit and systems. In a BIST design, the generation, application of the test vectors and analysis of the resulting response are part of the system or circuit under test. Weighted pseudorandom BIST schemes have been utilized in order to minimize the number of vectors to achieve complete fault coverage in BIST applications. In accumulator based 3-weight test pattern generation scheme, weighted sets comprising 3 weights namely 0, 1 and 0.5 have been successfully utilized, since they result in both low consumed power and low testing time.