An Accurate Probabilistic Reliability Model for Silicon PUFs

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Provided by: International Association for Cryptologic Research
Topic: Security
Format: PDF
The power of an accurate model for describing a physical process or designing a physical system is beyond doubt. The currently used reliability model for Physically Unclonable Functions (PUFs) assumes an equally likely error for every evaluation of every PUF response bit. This limits an accurate description since experiments show that certain responses are more error-prone than others, but this fixed error rate model only captures average case behavior. The authors introduce a new PUF reliability model taking this observed heterogeneous nature of PUF cells into account.
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