International Journal of Innovative Research in Electrical, Electronics, Instrumentation and Control Engineering (IJIREEICE)
With continued scaling of silicon process technology, producing reliable electronic components in extremely denser technologies pose a challenge. Further, the systems fabricated in deep sub-micron technology are prone to intermittent or transient faults, causing unidirectional errors, upon exposure to ionizing radiations during system operation. The ability to operate in the intended manner even in the presence of faults is an important objective of all electronic systems. In order to achieve fault-tolerance, each module of the system must be fault-tolerant by possessing run-time (or online) fault detection capabilities.